Edge Detection and Image Segmentation (EDISON) System
Table of Contents

The references cited below may be downloaded from our website at www.caip.rutgers.edu/riul/research/robust.html.

  1. D. Comanicu, P. Meer: "Mean shift: A robust approach toward feature space analysis." IEEE Trans. Pattern Anal. Machine Intell., 24, 603-619, May 2002.

  2. P. Meer, B. Georgescu: "Edge detection with embedded confidence." IEEE Trans. Pattern Anal. Machine Intell., 23, 1351-1365, December 2001.

  3. C. Christoudias, B. Georgescu, P. Meer: "Synergism in low-level vision." 16th International Conference on Pattern Recognition, Quebec City, Canada, August 2002, vol. IV, 150-155.

Robust Image Understanding Lab, (freeware) 2002